Visualization Techniques Related to Scanning Probe Microscopy
نویسندگان
چکیده
منابع مشابه
Scanning hall probe microscopy technique for investigation of magnetic properties
Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor. SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...
متن کاملScanning probe microscopy and related methods
Since the invention of scanning tunnelling microscopy (STM) [1] and atomic force microscopy (AFM) [2], a new class of local probe microscopes has entered the laboratories around the world. Scanning probe microscopy (SPM) uses probing tips to map properties, such as topography, local adhesive forces, elasticity, friction or magnetic properties. In the emerging fields of nanoscience and nanotechn...
متن کاملScanning hall probe microscopy technique for investigation of magnetic properties
Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor. SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...
متن کاملIntroduction to Scanning Probe Microscopy
Today’s research laboratory is required to solve difficult problems that span multiple disciplines. Advanced techniques are required to answer pressing questions related to adhesion, bonding, contamination and surface cleanliness, corrosion, surface morphology, surface roughness, surface topography, failure analysis, process monitoring, surface chemistry, biological characterization, local surf...
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ژورنال
عنوان ژورنال: IEEJ Transactions on Sensors and Micromachines
سال: 2000
ISSN: 1341-8939,1347-5525
DOI: 10.1541/ieejsmas.120.298